Bengaluru, India

Guruaj Gopal Putraya

This inventor holds 1 USPTO granted patent. Top assignee: Nokia Technologies Oy. Active years: 2016.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Guruaj Gopal Putraya. Retrieved from https://idiyas.com/inventor/guruaj-gopal-putraya

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2016

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Guruaj Gopal Putraya: Inventor in Plenoptic Imaging

Introduction

Guruaj Gopal Putraya is an inventor based in Bengaluru, India. His patent work includes a method for estimating disparity in plenoptic images, a technique relevant to interpreting visual information captured by focused plenoptic cameras.

Latest Patents

Putraya is associated with 1 patent: “Method, Apparatus and Computer Program Product for Disparity Estimation of Plenoptic Images.” The invention describes receiving a plenoptic image of a scene and generating a vector for each of its micro-images. It then estimates disparity by projecting each vector into subspaces associated with predetermined disparities, calculating residual errors, and comparing those errors to select a disparity.

Career Highlights

Putraya is associated with Nokia Technologies Oy. His patent reflects work on computational methods for analyzing plenoptic imagery, which captures scene information through an array of micro-images.

Collaborations

Ravi Shenoy and Basavaraja S. V. are identified as Putraya’s coworkers. Their shared association with Nokia Technologies Oy provides professional context for his work.

Conclusion

Guruaj Gopal Putraya’s patent focuses on estimating disparity in plenoptic images through vector projections and residual-error comparisons, highlighting his contribution to image-processing innovation.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…