The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 25, 2016

Filed:

Mar. 25, 2015
Applicant:

Nokia Technologies Oy, Espoo, FI;

Inventors:

Guruaj Gopal Putraya, Bangalore, IN;

Basavaraja S V, Bangalore, IN;

Mithun Uliyar, Bangalore, IN;

Ravi Shenoy, Bangalore, IN;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06T 7/00 (2006.01); H04N 13/02 (2006.01); H04N 13/00 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0055 (2013.01); G06T 2207/10028 (2013.01); G06T 2207/20228 (2013.01); H04N 13/0232 (2013.01); H04N 2013/0081 (2013.01);
Abstract

In an example embodiment, a method, apparatus and computer program product are provided. The method includes facilitating receipt of a plenoptic image associated with a scene, the plenoptic image including plenoptic micro-images and being captured by a focused plenoptic camera. The method includes generating plenoptic vectors for the plenoptic micro-images of the plenoptic image, where an individual plenoptic vector is generated for an individual plenoptic micro-image. The method includes assigning disparities for the plenoptic micro-images of the plenoptic image. A disparity for a plenoptic micro-image is assigned by accessing a plurality of subspaces associated with a set of pre-determined disparities, projecting a plenoptic vector for the plenoptic micro-image in the plurality of subspaces, calculating a plurality of residual errors based on projections of the plenoptic vector in the plurality of subspaces, and determining the disparity for the plenoptic micro-image based on a comparison of the plurality of residual errors.


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