Guipeng Tie

Title: Guipeng Tie: Innovator in Ion Source Technology

Introduction

Guipeng Tie is a notable inventor based in Hunan, China. He has made significant contributions to the field of ion source technology, particularly through his innovative patent. His work focuses on enhancing the precision and efficiency of ion beam polishing processes.

Latest Patents

Guipeng Tie holds a patent titled "Method for controlling dynamically controllable ultrawide-amplitude and high-response ion source." This patent presents a system and method for controlling a dynamically controllable ultrawide-amplitude and high-response ion source. The method includes resolving the dwell time of ion beam machining during iterative machining, selecting an appropriate velocity of a movable shaft of a machine tool based on the dwell time calculation, and dynamically calculating process parameters of an ion source. This innovation allows for real-time control of the ion beam polishing removal function, improving both precision and efficiency while reducing the requirements on the movement system of the machine tool.

Career Highlights

Guipeng Tie is affiliated with the National University of Defense Technology, part of the People's Liberation Army of China. His role at this prestigious institution allows him to contribute to advanced research and development in defense technology.

Collaborations

He has collaborated with notable colleagues such as Ye Tian and Feng Shi, further enhancing the impact of his work in the field.

Conclusion

Guipeng Tie's innovative contributions to ion source technology exemplify the importance of research and development in advancing precision machining techniques. His work continues to influence the field and improve manufacturing processes.