Company Filing History:
Years Active: 2007-2008
Title: Guenter Schmidt: Innovator in Semiconductor Technology
Introduction
Guenter Schmidt is a notable inventor based in Leun, Germany. He has made significant contributions to the field of semiconductor technology, holding a total of 2 patents. His work focuses on improving the efficiency and accuracy of wafer inspection and optical imaging systems.
Latest Patents
One of Schmidt's latest patents is a wafer inspection device designed for detecting defects on wafer surfaces. This innovative device features an air-cushion stage that can be displaced in two perpendicular directions (X, Y). It includes several air nozzles and at least one valve connected to an electric control unit, ensuring that normal pressure prevails in the air nozzles when activated.
Another significant patent is a method and apparatus for scanning a specimen using an optical imaging system. This invention involves a scanning stage that acquires images of the specimen through a camera and makes measurements using an optical measurement device. The scanning stage is calibrated by obtaining and storing height values at different positions, generating a running height profile. This allows for immediate image acquisition or measurements upon reaching the specimen points, compensating for any running errors.
Career Highlights
Guenter Schmidt is currently employed at Vistec Semiconductor Systems GmbH, where he continues to develop innovative solutions in semiconductor technology. His expertise and inventions have contributed to advancements in the industry, enhancing the capabilities of wafer inspection and optical imaging systems.
Collaborations
Throughout his career, Schmidt has collaborated with notable colleagues, including Dirk Sönksen and Robert Mainberger. These partnerships have fostered a collaborative environment that encourages innovation and the sharing of ideas.
Conclusion
Guenter Schmidt's contributions to semiconductor technology through his patents and collaborations highlight his role as a key innovator in the field. His work continues to influence advancements in wafer inspection and optical imaging systems, showcasing the importance of innovation in technology.