Aalborg, Denmark

Guenter Krenz

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Intel Corporation. Active years: 2017.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Guenter Krenz. Retrieved from https://idiyas.com/inventor/guenter-krenz-un1ojw3u

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

 

Average Co-Inventor Count = 10.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2017

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1 patent (USPTO):Explore Patents

Title: Guenter Krenz: Innovator in Throughput Characterization

Introduction

Guenter Krenz is a notable inventor based in Aalborg, Denmark. He has made significant contributions to the field of telecommunications, particularly in the area of throughput characterization for user equipment.

Latest Patents

Krenz holds a patent for a method and apparatus that characterizes the throughput of user equipment (UE) during transmission using a modulation and coding scheme (MCS). This innovation involves the interpolation of UE throughput for various discrete signal strength values, enhancing the efficiency of data transmission.

Career Highlights

Throughout his career, Guenter Krenz has worked with prominent companies, including Intel Corporation and Intel IP Corporation. His experience in these organizations has allowed him to develop and refine his expertise in telecommunications and data transmission technologies.

Collaborations

Krenz has collaborated with notable professionals in his field, including Jagjit Singh Ashta and Anatoliy Sergey Ioffe. These partnerships have contributed to the advancement of his research and innovations.

Conclusion

Guenter Krenz is a distinguished inventor whose work in throughput characterization has made a significant impact in telecommunications. His contributions continue to influence the development of efficient data transmission methods.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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