This inventor holds 1 USPTO granted patent. Top assignees: National Institute of Metrology, China, Tongji University. Active years: 2026.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2026
Title: Guangxu Xiao: Innovator in Fluorescence-Induced Effect Technologies
Introduction
Guangxu Xiao is a prominent inventor based in Shanghai, China. He has made significant contributions to the field of optical technologies, particularly through his innovative patent related to fluorescence-induced effects. His work has implications for various applications in metrology and optical engineering.
Latest Patents
Guangxu Xiao holds a patent titled "Methods and devices of 425NM wavelength reference construction based on fluorescence-induced effect." This patent describes a method and device that utilizes a continuously tunable laser, an atomic furnace, a chromium atomic beam, an optical frequency comb, a frequency doubling optical path, a bias-preserving fiber beam splitter, a bias-preserving fiber beam combiner, a beat-frequency detection optical path, an optoelectronic receiver, and a frequency counter atomic furnace. This innovative approach aims to enhance the precision of wavelength reference construction.
Career Highlights
Throughout his career, Guangxu Xiao has worked with esteemed institutions such as Tongji University and the National Institute of Metrology, China. His experience in these organizations has allowed him to collaborate with leading experts in the field and contribute to groundbreaking research.
Collaborations
Guangxu Xiao has collaborated with notable colleagues, including Xinbin Cheng and Xiao Deng. These partnerships have fostered a productive environment for innovation and research in optical technologies.
Conclusion
Guangxu Xiao's contributions to the field of fluorescence-induced effect technologies highlight his role as a key innovator. His patent and collaborations reflect his commitment to advancing optical engineering and metrology.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile