Company Filing History:
Years Active: 2006
Title: Gregory W Grant: Innovator in Electron Beam Micro Analysis
Introduction
Gregory W Grant is a notable inventor based in San Jose, CA (US). He has made significant contributions to the field of electron beam micro analysis. His innovative approach has led to the development of a unique method for measuring properties of samples using an electron beam.
Latest Patents
Gregory W Grant holds 1 patent for his invention titled "Site Stepping for Electron Beam Micro Analysis." This patent describes a method that involves defining coordinates of a measurement site on a sample and determining multiple measurement locations within that site. The electron beam is directed to these locations to measure the properties of the sample effectively.
Career Highlights
Gregory W Grant has established himself as a key figure in the field of electron beam technology. His work at Kla-Tencor Technologies Corporation has been instrumental in advancing the capabilities of electron beam micro analysis. His innovative methods have enhanced the precision and efficiency of measurements in various applications.
Collaborations
Throughout his career, Gregory has collaborated with esteemed colleagues, including Roger L Kroeze and David Aitan Soltz. These collaborations have contributed to the development of cutting-edge technologies in the field.
Conclusion
Gregory W Grant's contributions to electron beam micro analysis exemplify the spirit of innovation. His patented methods continue to influence the industry and pave the way for future advancements.