Company Filing History:
3 out of 12,890 
1 out of 8 
1 out of 5,671 
Years Active: 2000-2010
Title: Gregory A Dabney: Innovator in Semiconductor Testing
Introduction
Gregory A Dabney, based in Austin, TX, is a prominent inventor known for his contributions to semiconductor technology. With a total of four patents to his name, Dabney's work focuses on innovative methods and apparatuses that enhance the testing and analysis of semiconductor chips.
Latest Patents
Dabney's latest patents showcase his expertise in semiconductor testing. One notable patent is a "Method and Apparatus for Nano Probing a Semiconductor Chip," which details various techniques for electrically probing test circuits while inducing circuit perturbation. This method entails using a nano probe to contact conductor structures and applies an external stimulus to stimulate the chip's performance. The probe senses the electrical characteristics during testing, which is critical for evaluating chip functionality.
Another significant patent by Dabney is the "Laser Beam Induced Phenomena Detection." This invention describes an inspection apparatus that combines a laser scanning microscope with a circuit biasing source. The system detects changes in power conditions prompted by laser illumination, allowing for precise circuit analysis. A control system facilitates the scanning of the laser beam, enhancing inspection capabilities across various pixel locations.
Career Highlights
Throughout his career, Gregory A Dabney has held positions at leading technology companies, including Advanced Micro Devices Corporation and Semicaps Pte Ltd. His work at these organizations has significantly influenced semiconductor testing methodologies.
Collaborations
Dabney has collaborated with esteemed colleagues, such as Victoria Jean Bruce and Michael R Bruce. Their combined expertise has contributed to advancing semiconductor technology and achieving innovative solutions in the industry.
Conclusion
Gregory A Dabney is a notable figure in the realm of semiconductor innovation, with a strong portfolio of patents that demonstrate his dedication to improving testing methods. His work not only enhances the efficiency of semiconductor analysis but also paves the way for future advancements in the field.