Gregor Dellemann

Title: Gregor Dellemann: Innovator in Particle Beam Microscopy

Introduction

Gregor Dellemann is a notable inventor based in Aalen, Germany. He has made significant contributions to the field of particle beam microscopy, holding 3 patents that showcase his innovative methods and techniques.

Latest Patents

One of his latest patents is a method for operating a multi-beam particle beam microscope. This method involves scanning a multiplicity of particle beams over an object and directing electron beams emanating from impingement locations of the particle beams at the object onto an electron converter. The process includes detecting first signals generated by impinging electrons in the electron converter via a plurality of detection elements of a first detection system during a first time period. Additionally, it involves detecting second signals generated by impinging electrons in the electron converter via a plurality of detection elements of a second detection system during a second time period. The signals detected during the first time period are then assigned to the impingement locations based on the detection signals from the second detection system.

Career Highlights

Gregor Dellemann is currently employed at Carl Zeiss Multisem GmbH, a company renowned for its advancements in microscopy technology. His work at this organization has allowed him to further develop his expertise and contribute to cutting-edge innovations in the field.

Collaborations

Some of his notable coworkers include Dirk Zeidler and Gunther Scheunert, who collaborate with him on various projects within the company.

Conclusion

Gregor Dellemann's contributions to particle beam microscopy through his patents and work at Carl Zeiss Multisem GmbH highlight his role as an influential inventor in the field. His innovative methods continue to advance the capabilities of microscopy technology.