Greg Olmstead

Title: Greg Olmstead: Innovator in Semiconductor Inspection Technologies

Introduction

Greg Olmstead is a notable inventor based in Sammamish, WA (US). He has made significant contributions to the field of semiconductor inspection technologies. With a total of 3 patents to his name, Olmstead has developed innovative methods and devices that enhance the functionality and efficiency of probe cards.

Latest Patents

One of his latest patents is titled "Method of measuring and assessing a probe card with an inspection device." This method involves providing a probe card analyzer without a probe card interface, removably coupling a probe card to a support plate, aligning a sensor head with the probe card, and measuring a component of the probes. Another significant patent is "Inspection device with vertically moveable assembly." This invention minimizes deflection in the checkplate and probe card during the inspection of semiconductors. It includes a housing, a toggle assembly, and an objective lens assembly that is deflectable along an optics axis.

Career Highlights

Greg Olmstead is currently employed at Rudolph Technologies, Inc., where he continues to innovate in the semiconductor industry. His work focuses on improving inspection technologies that are crucial for the manufacturing of semiconductors.

Collaborations

Olmstead collaborates with Gary Mark Gunderson, a fellow innovator in the field. Their combined expertise contributes to advancements in semiconductor inspection technologies.

Conclusion

Greg Olmstead's contributions to semiconductor inspection technologies through his patents and collaborations highlight his role as a key innovator in the industry. His work continues to influence the efficiency and effectiveness of semiconductor manufacturing processes.