Greg Horner

Title: Greg Horner: Innovator in Semiconductor Technology

Introduction

Greg Horner is a notable inventor based in Santa Clara, California. He has made significant contributions to the field of semiconductor technology, particularly in the detection of metal contamination on semiconductor wafers. His innovative approach has the potential to enhance the quality and reliability of semiconductor devices.

Latest Patents

Greg Horner holds a patent for a "Method and system for detecting metal contamination on a semiconductor wafer." This patent describes a method to detect metal contamination on a semiconductor topography, which may include a semiconductor substrate or a dielectric material. The method involves an annealing process that can drive metal contamination into the semiconductor substrate or dielectric material. Following this process, a charge is deposited on the upper surface of the semiconductor topography, allowing for the measurement of its electrical properties. This method can determine characteristics of various types of metal contamination, making it a valuable tool in semiconductor manufacturing.

Career Highlights

Greg Horner is currently employed at Kla-Tencor Technologies Corporation, where he continues to work on advancing semiconductor technologies. His expertise in detecting metal contamination has positioned him as a key player in the industry.

Collaborations

Throughout his career, Greg has collaborated with talented individuals such as Zhiwei Xu and Arun Srivatsa. These collaborations have contributed to the development of innovative solutions in semiconductor technology.

Conclusion

Greg Horner's work in semiconductor technology, particularly his patented method for detecting metal contamination, showcases his innovative spirit and dedication to improving the industry. His contributions are essential for the advancement of semiconductor manufacturing processes.