Bothwell, United Kingdom

Graham Martin

This inventor holds 1 USPTO granted patent. Top assignee: Impact Technologies, LLC. Active years: 2012.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Graham Martin. Retrieved from https://idiyas.com/inventor/graham-martin

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2012

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1 patent (USPTO):Explore Patents

Title: Innovations by Graham Martin: A Focus on Metallic Debris Detection

Introduction

Graham Martin is an accomplished inventor based in Bothwell, GB. He has made significant contributions to the field of sensor technology, particularly with his innovative approach to detecting metallic debris generated from machine wear. His work is essential for improving machinery efficiency and safety.

Latest Patents

Graham Martin holds a patent for a "Metallic debris detection sensor." This invention relates to a sensor arrangement designed to measure magnetically active or ferrous debris. The sensor features a magnetic sensor head that produces a magnetic field, a magnetic field sensor responsive to changes in that field, a temperature probe, and processing means to determine the amount of debris accumulated on the magnetic sensor head based on both magnetic field and temperature data.

Career Highlights

Throughout his career, Graham has been associated with Impact Technologies, LLC, where he has applied his expertise in sensor technology. His work has contributed to advancements in the detection of machine wear, which is crucial for maintaining operational efficiency in various industries.

Collaborations

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Conclusion

Graham Martin's innovative work in developing a metallic debris detection sensor showcases his commitment to enhancing machine safety and efficiency. His contributions are valuable to the field of sensor technology and have the potential to impact various industries positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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