Company Badge
USPTO Data Jan 1 1976 - Oct 13 2026
10 Patents
#1 in Cleverdale, NY
#1,745 in New York
#29,866 in US
#56,047 in the World
Impact Technologies, LLC
Forward Citations = 128
16 inventors:
Cleverdale, NY, United States of America
Impact Technologies, LLC
% Expired Patents = 20.0
Trademarks = 1
Forward Citations = 128
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16 inventors (with patents filed for the assignee):
Jason E Kirshon (5 out of 5 patents)
Carl S Byington (3 out of 5 patents)
Ryan C Brewer (2 out of 4 patents)
4. Matthew J Watson (2 out of 2 patents)
5. Patrick W Kalgren (1 out of 3 patents)
6. Antonio Ginart (1 out of 3 patents)
7. Anthony J Boodhansingh (1 out of 2 patents)
8. Rolf Orsagh (1 out of 2 patents)
9. Brian Sipos (1 out of 2 patents)
10. Douglas W Brown (1 out of 2 patents)
11. Graham Martin (1 out of 1 patent)
12. Sashank Nanduri (1 out of 1 patent)
13. Christopher M Minnella (1 out of 1 patent)
14. Mark Baybutt (1 out of 1 patent)
15. Wen-mei William Hwu (1 out of 9 patents)
10 patents:
Company Overview
Impact Technologies, LLC, based in Cleverdale, NY, specializes in advanced engineering solutions and technology development. The company focuses on providing innovative products and services across various sectors, including aerospace, defense, and industrial applications. With a commitment to enhancing operational efficiency and safety, Impact Technologies leverages cutting-edge research in areas such as systems engineering, data analytics, and software development to deliver tailored solutions that meet the evolving needs of its clients.
Profile summary synthesized from public USPTO records and patent filings.
IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Impact Technologies, LLC. Retrieved from https://idiyas.com/company/impact-technologies
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]