Company Filing History:
Years Active: 2018
Title: Gordana Neskovic: Innovator in Surface Metrology
Introduction
Gordana Neskovic is a prominent inventor based in Santa Clara, CA. She has made significant contributions to the field of surface metrology, particularly in the design of inspection methods for wafers. Her innovative approach has led to the development of a patented technology that enhances the accuracy of wafer inspections.
Latest Patents
Neskovic holds a patent titled "Haze and defect distribution and aperture configuration in surface metrology inspectors." This patent outlines a method for designing an aperture in a mask used for inspecting wafers. The method involves scanning a collection plane of the wafer at multiple points and collecting data for at least a part of the wafer. Additionally, it includes mapping the collected data and configuring the aperture based on this mapped information. This innovation is crucial for improving the precision of surface inspections in semiconductor manufacturing.
Career Highlights
Gordana Neskovic is currently employed at KLA-Tencor Corporation, a leading company in the field of process control and yield management solutions for the semiconductor industry. Her work at KLA-Tencor has positioned her as a key player in advancing technologies that ensure the quality and reliability of semiconductor devices.
Collaborations
Throughout her career, Neskovic has collaborated with notable colleagues, including Chuanyong Huang and Raymond Chu. These collaborations have fostered an environment of innovation and have contributed to the development of cutting-edge technologies in the field.
Conclusion
Gordana Neskovic is a trailblazer in the realm of surface metrology, with her patented methods significantly impacting the semiconductor industry. Her dedication to innovation and collaboration continues to drive advancements in wafer inspection technologies.