This inventor holds 1 USPTO granted patent. Top assignee: Kla Tencor Corporation. Active years: 2011.
Company Filing History:
Years Active: 2011
Title: Glenn Florence: Innovator in Computer-Implemented Methods
Introduction
Glenn Florence is a notable inventor based in Pocatello, ID (US). He has made significant contributions to the field of computer-implemented methods, particularly in the area of defect detection on wafers. His innovative approach has led to the development of a unique patent that addresses systematic and random defects.
Latest Patents
Glenn Florence holds a patent for "Computer-implemented methods for determining if actual defects are potentially systematic defects or potentially random defects." This patent includes various methods for comparing actual defects detected on a wafer to randomly generated defects. The method aims to determine whether the actual defects are systematic or random based on the comparison results. This innovation is crucial for improving the accuracy of defect detection in semiconductor manufacturing.
Career Highlights
Glenn is currently employed at Kla Tencor Corporation, where he applies his expertise in defect detection and analysis. His work has been instrumental in advancing the technology used in the semiconductor industry. With a focus on enhancing the reliability of defect detection methods, Glenn has established himself as a key figure in his field.
Collaborations
Glenn has collaborated with notable colleagues, including Allen Park and Peter Rose. These partnerships have fostered a collaborative environment that encourages innovation and the sharing of ideas.
Conclusion
Glenn Florence's contributions to the field of computer-implemented methods have made a significant impact on defect detection in semiconductor manufacturing. His innovative patent and collaborative efforts highlight his dedication to advancing technology in this critical area.