Snohomish, WA, United States of America

Glen R Engel


Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 15(Granted Patents)


Company Filing History:


Years Active: 2011

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1 patent (USPTO):Explore Patents

Title: Glen R Engel: Innovator in Test Probe Management

Introduction: Glen R Engel is an established inventor based in Snohomish, Washington, renowned for his contributions to measurement system technologies. With a focus on enhancing test probe management, Engel has developed innovative solutions that streamline operations in various measurement environments.

Latest Patents: Engel holds a patent for a "System and Method for Test Probe Management." This invention allows for individual probe management by communicating configuration data to each probe based on its received metadata. In this approach, the configuration data is transmitted from a server, which does not store the probe's configuration, enabling a flexible and efficient management system. The types of configuration data transmitted can include parameters for direct probe configuration or software modules designed to operate on the probe.

Career Highlights: Engel’s professional journey includes significant experience at JDS Uniphase Corporation, a global leader in communications and optical products. His role in advancing test probe management reflects his commitment to innovation and efficiency within measurement systems.

Collaborations: Throughout his career, Engel has collaborated with notable colleagues, including Glen L Purdy, Jr. and Jerry J Liu. These professional relationships have fostered an environment of shared knowledge and creativity, contributing to significant advancements in their respective fields.

Conclusion: Glen R Engel is a distinguished inventor whose work on test probe management has implications for a variety of industries. His patent showcases how targeted innovations can lead to improved efficiency and functionality in complex measurement environments. Engel's contributions, alongside his collaborative efforts, continue to shape the future of measurement technology.

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