The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 11, 2011
Filed:
Sep. 20, 2005
Applicants:
Glen R. Engel, Snohomish, WA (US);
Glen L. Purdy, Jr., Snohomish, WA (US);
Jerry J. Liu, Sunnyvale, CA (US);
Inventors:
Glen R. Engel, Snohomish, WA (US);
Glen L. Purdy, Jr., Snohomish, WA (US);
Jerry J. Liu, Sunnyvale, CA (US);
Assignee:
JDS Uniphase Corporation, Milpitas, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G08C 17/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
Individual probe management is accomplished in a measurement system by communicating configuration data to each probe based on that probe's received metadata. In one embodiment, the configuration data is sent from a server and the server does not keep track of the probe's configuration. The configuration data can be, for example, parameters used to directly configure the probe or software modules for running on the probe.