Glen D Caby

Title: Glen D Caby: Innovator in BIST Circuitry

Introduction

Glen D Caby is a notable inventor based in Tempe, AZ (US). He has made significant contributions to the field of built-in self-test (BIST) circuitry, holding a total of 3 patents. His work focuses on enhancing data analysis and testing methodologies for integrated circuits.

Latest Patents

One of Glen's latest patents is titled "Enhanced data analyzer for use in BIST circuitry." This invention provides a data analyzer that allows both comparison analysis and signature analysis to be performed on a circuit response data stream. The data analyzer includes multiple data registers that are serially coupled, enabling each register to perform analysis on individual data bits. This innovation ensures that the circuit under test can be thoroughly examined for faults.

Another significant patent is the "Combinational data generator and analyzer for built-in self test." This invention involves a BIST circuit that verifies the operation of a circuit under test within an integrated circuit. The BIST generates a series of test vectors using a linear feedback shift register (LFSR) and applies these vectors to the circuit. The output signal from the circuit is routed back and accumulated in a predetermined manner within the LFSR, providing a test signature. This allows the same components generating the test vector to also perform the accumulation of the test signature.

Career Highlights

Glen D Caby is currently employed at Motorola Corporation, where he continues to innovate in the field of circuit testing. His work has been instrumental in advancing the reliability and efficiency of integrated circuits.

Collaborations

Glen has collaborated with notable coworkers such as Nicholas J Spence and Robert A Fuller, contributing to various projects and innovations in the field.

Conclusion

Glen D Caby's contributions to BIST circuitry and data analysis have made a significant impact in the field of integrated circuits. His innovative patents reflect his dedication to enhancing testing methodologies and ensuring the reliability of electronic devices.