This inventor holds 1 USPTO granted patent. Top assignee: The Boeing Company. Active years: 2021.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2021
Title: Glen Anthony Journeay: Innovator in Integrated Standardized Metrology Systems
Introduction
Glen Anthony Journeay is a notable inventor based in Poulsbo, WA (US). He has made significant contributions to the field of metrology through his innovative work. His expertise is exemplified by his patent for an Integrated Standardized Metrology System (ISMetS).
Latest Patents
Glen Journeay holds a patent for an Integrated Standardized Metrology System (ISMetS). This patent encompasses systems, methods, and apparatus designed to enhance metrology processes. The disclosed metrology system includes a processor that receives an XML metrology file, which contains metrology actions for instruments measuring objects. The system translates this file into a human-machine interface (HMI) metrology file, generates a graphical user interface (GUI), and creates a command file based on user input. Ultimately, the system translates these commands into actionable files for metrology instruments, enabling precise measurements.
Career Highlights
Glen Journeay is associated with The Boeing Company, where he applies his innovative skills in metrology. His work contributes to the advancement of measurement technologies within the aerospace industry. His dedication to improving metrology systems showcases his commitment to innovation.
Collaborations
Glen has collaborated with notable colleagues, including Paul Frederic Sjoholm and Jonathan Gorman Cook, Jr. These collaborations have likely enriched his work and contributed to the development of advanced metrology solutions.
Conclusion
Glen Anthony Journeay is a distinguished inventor whose work in integrated standardized metrology systems has made a significant impact. His patent reflects his innovative spirit and dedication to enhancing measurement technologies. His contributions continue to influence the field of metrology and the aerospace industry.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
