The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 23, 2021
Filed:
Mar. 30, 2018
The Boeing Company, Chicago, IL (US);
Glen Anthony Journeay, Poulsbo, WA (US);
Paul F. Sjoholm, Renton, WA (US);
Jonathan Gorman Cook, Jr., Seattle, WA (US);
Khanh Quoc Hoang, Federal Way, WA (US);
The Boeing Company, Chicago, IL (US);
Abstract
Systems, methods, and apparatus for an integrated standardized metrology system (ISMetS) are disclosed. A disclosed metrology system comprises at least one processor to receive an XML metrology file that comprises at least one metrology action for a metrology instrument to measure at least one object, to translate the XML metrology file into a human machine interface (HMI) metrology file, to generate a graphical user interface (GUI) based on the HMI metrology file, to generate a HMI metrology command file according to a command from a user via the GUI, to translate the HMI metrology command file into a metrology instrument software command file, and to translate the metrology instrument software command file into a metrology instrument command file. The system further comprises the metrology instrument to measure at least one object, according to the metrology instrument command file, to obtain measurements for at least one object.