This inventor holds 1 USPTO granted patent. Top assignee: General Electric Company. Active years: 1982.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 1982
Title: Gilbert B. Porter III: Innovator in Non-Contact Measurement Technology
Introduction
Gilbert B. Porter III is a notable inventor based in Schenectady, NY (US). He has made significant contributions to the field of optical measurement technology. His innovative approach has led to the development of a unique patent that enhances the accuracy of surface profile measurements.
Latest Patents
Porter holds a patent for a method titled "Non-contact measurement of surface profile." This invention utilizes a parallax method of wavelength labeling based on optical triangulation. A complementary color pattern is projected onto the surface, characterized by a continuous variation of the power ratio of two wavelength bands. The profile can be measured at all points in the field of view. Shifts of the wavelength bands on separate detector arrays correspond to profile deviations. A signal processor calculates a normalized signal that is independent of surface reflectivity and roughness variations. The phase shift of this signal yields depth data from which the surface profile can be mapped. This patent showcases his innovative thinking and technical expertise.
Career Highlights
Gilbert B. Porter III is associated with General Electric Company, where he has applied his skills in optical measurement technology. His work has contributed to advancements in various applications, enhancing the capabilities of measurement systems.
Collaborations
Porter has collaborated with notable colleagues, including Joseph Leagrand Mundy and Thomas M. Cipolla. These collaborations have fostered an environment of innovation and have led to the development of cutting-edge technologies.
Conclusion
Gilbert B. Porter III is a distinguished inventor whose work in non-contact measurement technology has made a significant impact. His patent reflects his commitment to advancing optical measurement techniques. His contributions continue to influence the field and inspire future innovations.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
