The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 14, 1982
Filed:
Jun. 11, 1980
Joseph L Mundy, Schenectady, NY (US);
Gilbert B Porter, III, Schenectady, NY (US);
Thomas M Cipolla, Ballston Lake, NY (US);
General Electric Company, Schenectady, NY (US);
Abstract
A parallax method of wavelength labeling is based on optical triangulation. A complementary color pattern projected onto the surface is characterized by a continuous variation of the power ratio of two wavelength bands, and the profile can be measured at all points in the field of view. Shifts of the wavelength bands on separate detector arrays correspond to profile deviations. A signal processor calculates a normalized signal that is independent of surface reflectivity and roughness variations; the phase shift of this signal yields depth data from which the surface profile can be mapped.