Essex Junction, VT, United States of America

Gie Lee


Average Co-Inventor Count = 9.5

ph-index = 1

Forward Citations = 6(Granted Patents)


Location History:

  • Colchester, VT (US) (2009)
  • Essex Junction, VT (US) (2013)

Company Filing History:


Years Active: 2009-2013

where 'Filed Patents' based on already Granted Patents

2 patents (USPTO):

Title: The Innovative Mind of Gie Lee: Patents and Contributions

Introduction: Gie Lee, an accomplished inventor based in Essex Junction, Vermont, has made significant contributions to the field of statistical modeling and semiconductor yield estimation. With two patents to his name, Lee's innovative approaches demonstrate a deep understanding of complex systems and methodologies.

Latest Patents: His most recent patents include groundbreaking methods that focus on statistical interpolation and yield modeling for semiconductor products. The first patent, titled "Method of distributing a random variable using statistically correct spatial interpolation continuously with spatially inhomogeneous statistical correlation versus distance, standard deviation, and mean," introduces a novel technique for modeling random variables by defining seed points and utilizing spatial interpolation to enhance accuracy. The second patent, "Equivalent gate count yield estimation for integrated circuit devices," presents a method for modeling expected faults in semiconductor products, facilitating better yield predictions through critical area analysis and database establishment for library elements.

Career Highlights: Gie Lee's career is marked by his work at the International Business Machines Corporation (IBM), where he has applied his innovative methods to improve semiconductor product designs. His contributions have significantly advanced the understanding of yield estimation processes and statistical modeling.

Collaborations: Lee has collaborated with esteemed colleagues, including John Maxwell Cohn and Ulrich Alfons Finkler, fostering an environment of creativity and innovation. Their teamwork has led to advancements in technology and improved methodologies in the fields they work within.

Conclusion: Gie Lee is a remarkable inventor whose patents demonstrate his commitment to innovation and excellence. His work at IBM and collaborations with esteemed colleagues have positioned him as a notable figure in statistical modeling and semiconductor technology. With his refined methods, Gie Lee continues to impact the industry, paving the way for future advancements.

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