Mai-Lie, Taiwan

Gey-Fung Wei

This inventor holds 1 USPTO granted patent. Top assignee: Taiwan Semiconductor Manufacturing Comp. Ltd.. Active years: 1999.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Gey-Fung Wei. Retrieved from https://idiyas.com/inventor/gey-fung-wei

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 1999

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1 patent (USPTO):Explore Patents

Title: Gey-Fung Wei: Innovator in Semiconductor Technology

Introduction

Gey-Fung Wei is a notable inventor based in Mai-Lie, Taiwan. He has made significant contributions to the field of semiconductor technology, particularly in the area of photoresist development.

Latest Patents

Gey-Fung Wei holds a patent titled "Method for cleaning a photoresist developer spray stream nozzle." This invention provides a method and apparatus for cleaning a spray stream nozzle used in dispensing a photoresist developer solution onto a photoexposed blanket photoresist layer over a semiconductor substrate. The process involves using a spray stream nozzle with at least one aperture, delivering a sufficient volume of photoresist developer solution, and subsequently using a solvent that does not clog the nozzle. He has 1 patent to his name.

Career Highlights

Gey-Fung Wei is associated with Taiwan Semiconductor Manufacturing Company Limited, a leading firm in the semiconductor industry. His work has contributed to advancements in manufacturing processes and efficiency.

Collaborations

He has collaborated with notable colleagues, including Tsun-Ching Lin and Hsiao-Lan Yeh, enhancing the innovation landscape within his field.

Conclusion

Gey-Fung Wei's contributions to semiconductor technology through his innovative patent demonstrate his commitment to advancing the industry. His work continues to influence the development of efficient manufacturing processes in semiconductor production.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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