Geunbae Lim

Title: **Geunbae Lim: Innovator in Scanning Probe Microscopy**

Introduction

Geunbae Lim, based in Suwon, South Korea, is a notable inventor with a significant contribution to the field of scanning probe microscopy. With a total of five patents to his name, his innovative work primarily revolves around enhancing the functionalities of scanning probe microscopes.

Latest Patents

One of Lim's latest patents, titled "Method of Fabricating a Probe of a Scanning Probe Microscope (SPM) Having a Field-Effect Transistor Channel," showcases his expertise in creating advanced SPM probes. This invention features a probe designed with a field-effect transistor (FET) structure at its tip. The manufacturing process involves etching a single crystalline silicon substrate into a V-shaped groove and doping the etching sloping sides with impurities, allowing for the formation of a source, channel, and drain, which significantly improves the functionality of SPM probes.

He has another patent titled "Scanning Probe Microscope (SPM) Probe Having Field Effect Transistor Channel and Method of Fabricating the Same," further emphasizing his innovative approach in this field. Both patents highlight his commitment to advancing technology in microscopic imaging.

Career Highlights

Geunbae Lim has worked with leading organizations, including Samsung Electronics Co., Ltd. His experience in these reputable companies has allowed him to contribute significantly to both research and practical applications in technology.

Collaborations

Throughout his career, Lim has collaborated with esteemed colleagues such as Yukeun Eugene Pak and Hayong Yun, further enriching his innovative journey through shared knowledge and expertise.

Conclusion

Geunbae Lim is a prominent figure in the innovation landscape, particularly in the domain of scanning probe microscopy. His groundbreaking patents not only demonstrate his inventiveness but also pave the way for further advancements in this crucial area of research and technology.