This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Anton Paar Gmbh. Active years: 2021.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2021
Title: Gernot Leuprecht: Innovator in Measuring Probe Technology
Introduction
Gernot Leuprecht is a notable inventor based in St. Radegund, Austria. He has made significant contributions to the field of measuring probe technology, particularly in the context of scanning probe microscopes. His innovative approach has led to the development of a unique handling device that enhances the functionality and efficiency of measuring probes.
Latest Patents
Gernot Leuprecht holds 1 patent for his invention titled "Handling device for handling a measuring probe." This patent describes a handling apparatus designed for managing a measuring probe of a scanning probe microscope. The invention features a receiving device for the measuring probe, a guide structure that allows for the probe's movement while ensuring that the probe body is partially limited, and a transport device that facilitates the probe's transition from the receiving area to a target area.
Career Highlights
Gernot Leuprecht is associated with Anton Paar GmbH, a company renowned for its precision measurement instruments. His work at Anton Paar has allowed him to focus on advancing technologies that improve measurement accuracy and efficiency in scientific research.
Collaborations
Gernot has collaborated with talented coworkers, including Daniel Koller and Norbert Pinno-Rath. Their combined expertise contributes to the innovative environment at Anton Paar, fostering advancements in measurement technology.
Conclusion
Gernot Leuprecht's contributions to measuring probe technology exemplify the spirit of innovation in scientific research. His patent for a handling device showcases his commitment to enhancing measurement techniques, making a lasting impact in the field.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
