The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 01, 2021
Filed:
Sep. 13, 2018
Applicant:
Anton Paar Gmbh, Graz, AT;
Inventors:
Assignee:
Anton Paar GmbH, Graz, AT;
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 21/00 (2006.01); G01Q 60/16 (2010.01); G01Q 60/38 (2010.01); G01Q 70/02 (2010.01);
U.S. Cl.
CPC ...
G02B 21/002 (2013.01); G01Q 60/16 (2013.01); G01Q 60/38 (2013.01); G01Q 70/02 (2013.01);
Abstract
A handling apparatus for handling a measuring probe of a scanning probe microscope is disclosed. The measuring probe has a probe body and a probe tip which is coupled with the probe body by a cantilever. The handling apparatus includes a receiving device for receiving the measuring probe at a receiving area, a guide structure, in which the measuring probe is guidable while at the same time the probe body is at least partially limited and the cantilever and the probe tip are supported without contact, and a transport device for transporting the measuring probe from the receiving area along the guide structure to a target area.