Gerhard Loffler

Title: Gerhard Loffler: Innovator in Opto-Electronic Measurement Technology

Introduction

Gerhard Loffler is a notable inventor based in Munich, Germany. He has made significant contributions to the field of opto-electronic measurement technology. His innovative approach has led to the development of a unique patent that enhances the precision of dimensional inspections.

Latest Patents

Gerhard Loffler holds a patent for a process and apparatus designed for the determination of dimensions of elongated objects. This invention features an opto-electronic measuring bench that automates the dimensional inspection of externally turned parts. The test object is illuminated linearly, producing images of two diametrically opposed contour points on two rows of photodiodes. The diameter of the shafts can be determined from the position of these images, recognized as intensity jumps, and the electrically determined distance between the two rows of diodes. The rows of diodes can be moved along with the light sources in the axial direction of the test object, allowing for diameter measurements across the entire axial length. Additionally, the distance of the diode rows from a starting position is determined electrically, enabling length measurements of the test object.

Career Highlights

Gerhard Loffler is associated with Oem Messtechnik GmbH, where he applies his expertise in measurement technology. His work has been instrumental in advancing the capabilities of automated inspection systems.

Collaborations

Throughout his career, Gerhard has collaborated with notable colleagues, including Hans-Ulrich Dassler and Rudiger Haas. These partnerships have contributed to the development of innovative solutions in the field.

Conclusion

Gerhard Loffler's contributions to opto-electronic measurement technology exemplify the impact of innovation in enhancing precision in industrial applications. His patent reflects a commitment to advancing measurement techniques, making him a significant figure in his field.