The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 15, 1988
Filed:
Jun. 13, 1986
Hans-Ulrich Dassler, Oberschleissheim, DE;
Rudiger Haas, Faistenhaar, DE;
Gerhard Loffler, Munich, DE;
OEM Messtechnik GmbH, , DE;
Abstract
An opto-electronic measuring bench for the automatic dimensional inspection of externally turned parts, where the test object is linearly illuminated and an image of two diametrically opposed contour points produced on two rows of photodiodes. The diameter of the shafts may be determined from the position of the images of the two contour points recognized as intensity jumps and the electrically determined distance of the two rows of diodes. The rows of diodes may be moved together with the light sources in the axial direction of the test object, in order to carry out diameter measurements over the entire axial length of the test object. The distance of the diode rows in the axial direction from a starting position is also determined electrically, so that length measurements of the test object are also possible.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile