Gerald Matusiewicz

Title: Gerald Matusiewicz: Innovator in Test Pad Structures

Introduction

Gerald Matusiewicz is a notable inventor based in Poughkeepsie, NY (US). He has made significant contributions to the field of semiconductor technology, particularly in the development of test pad structures. With a total of 10 patents to his name, Matusiewicz has demonstrated a commitment to innovation and excellence in his work.

Latest Patents

One of Matusiewicz's latest patents is focused on a test pad structure for the reuse of interconnect level masks. This invention involves a test pad structure in a back-end-of-line metal interconnect structure, formed by the repeated use of the same mask set. The mask set includes a first line level mask, a first via level mask, a second line level mask, and a second via level mask. The test pad structure features a two-dimensional array of test pads, where a first row is connected to a device macro structure at the same level, while test pads in another row are electrically connected to another device macro structure of the same design at an underlying level. The design allows for lateral shifting of electrical connections among pads located at different levels, enabled by lateral extension portions that protrude from the pads and via structures that contact these extensions. This innovative test pad structure includes more levels of testable metal interconnect structure than the number of used lithographic masks.

Career Highlights

Throughout his career, Matusiewicz has worked with prominent companies in the technology sector. He has been associated with International Business Machines Corporation (IBM) and Globalfoundries Inc., where he has contributed to various projects and advancements in semiconductor technology.

Collaborations

Matusiewicz has collaborated with several talented individuals in his field, including Tom C Lee and Dinesh A Badami. These collaborations have further enriched his work and contributed to the success of his inventions.

Conclusion

Gerald Matusiewicz is a distinguished inventor whose work in test pad structures has made a significant impact in the semiconductor industry. His innovative patents and collaborations reflect his dedication to advancing technology and improving manufacturing processes.