Vista, CA, United States of America

Gerald Gerent

This inventor holds 2 USPTO granted patents. Top assignee: Hexagon Metrology Gmbh. Active years: 2020-2021.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Gerald Gerent. Retrieved from https://idiyas.com/inventor/gerald-gerent

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.4

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2020-2021

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2 patents (USPTO):Explore Patents

Title: Gerald Gerent: Innovator in Optical Scanning Technology

Introduction

Gerald Gerent is a notable inventor based in Vista, California. He has made significant contributions to the field of optical scanning technology, holding 2 patents that showcase his innovative spirit and technical expertise.

Latest Patents

One of Gerald's latest patents focuses on the thermal management of an optical scanning device. This invention addresses the issue of thermal variations that can affect measurements made by such devices. He presents various methods to control the temperature of the device and compensate for any temperature variations that may occur. This advancement is crucial for enhancing the accuracy and reliability of optical scanning technologies.

Career Highlights

Gerald is currently employed at Hexagon Metrology GmbH, where he continues to develop cutting-edge solutions in the field of metrology. His work is instrumental in pushing the boundaries of what is possible in optical scanning and measurement technologies.

Collaborations

Throughout his career, Gerald has collaborated with talented individuals such as David Demiter and Dongmei Hong. These partnerships have fostered a creative environment that encourages innovation and the sharing of ideas.

Conclusion

Gerald Gerent's contributions to optical scanning technology through his patents and collaborations highlight his role as a key innovator in the field. His work not only advances technology but also sets a standard for future developments in optical measurement systems.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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