The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 01, 2021

Filed:

Nov. 13, 2018
Applicant:

Hexagon Metrology, Inc., North Kingstown, RI (US);

Inventors:

Tom Bauer, Vista, CA (US);

Gerald Gerent, Vista, CA (US);

David Demiter, Encinitas, CA (US);

Assignee:

HEXAGON METROLOGY, INC., North Kingstown, RI (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/25 (2006.01); G01B 5/00 (2006.01); G01B 5/004 (2006.01); G01B 11/14 (2006.01); G01B 21/04 (2006.01); G06T 7/60 (2017.01); H04N 1/024 (2006.01);
U.S. Cl.
CPC ...
G01B 11/2513 (2013.01); G01B 5/004 (2013.01); G01B 5/0014 (2013.01); G01B 11/14 (2013.01); G01B 21/04 (2013.01); G06T 7/60 (2013.01); H04N 1/02481 (2013.01);
Abstract

Thermal variations on an optical scanning device can affect measurements made by that device. Various ways are presented here to control the temperature of a device and compensate for temperature variations of the device.


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