Gerald F Muething, Jr

Title: Gerald F Muething, Jr: Innovator in CMOS Testing Technology

Introduction

Gerald F Muething, Jr. is a notable inventor based in Pleasanton, CA (US), recognized for his contributions to the field of automatic test equipment for semiconductor devices. With a total of 5 patents, he has made significant advancements in CMOS testing technology, focusing on improving timing accuracy and channel density.

Latest Patents

One of his latest patents is the "Low cost CMOS tester with edge rate compensation." This invention addresses the challenges of timing accuracy in CMOS circuitry by employing several innovative techniques. A delay locked loop compensates for timing variations caused by process variations and temperature changes. Additionally, a frequency-dependent heating element mitigates temperature-induced changes in propagation delays. The design reduces the number of circuit elements in critical timing paths, enhancing overall performance.

Another significant patent is the "Low cost CMOS tester with high channel density." This automatic test equipment integrates numerous channels of electronic circuitry, generating precisely timed test signals. By incorporating multiple channels on a single integrated circuit chip, the invention achieves substantial cost and size advantages. Design techniques such as guard rings, separate signal traces for power and ground, and a fine delay element design contribute to maintaining timing accuracy while allowing for high levels of integration.

Career Highlights

Gerald has worked with prominent companies in the industry, including Teradyne, Inc. and I-tek, Inc. His experience in these organizations has allowed him to refine his skills and contribute to the development of cutting-edge testing technologies.

Collaborations

Throughout his career, Gerald has collaborated with talented individuals such as George W Conner and Ronald A Sartschev. These partnerships have fostered innovation and the exchange of ideas, further enhancing the impact of his work.

Conclusion

Gerald F Muething, Jr. stands out as an influential inventor in the realm of CMOS testing technology. His innovative patents and contributions to the industry reflect his commitment to advancing semiconductor testing methods.