The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 27, 1987
Filed:
Oct. 25, 1984
Gerald F Muething, Jr, Pleasanton, CA (US);
Nicolet Instrument Corporation, Madison, WI (US);
Abstract
A method for measuring channel-to-channel skew or phase difference in an electronic system of the type having a plurality of input channels which are sampled by sampling pulses having a frequency f.sub.o and a period P.sub.o. The sampling pulses at each input channel are first mixed with a reference signal having a frequency f.sub.r and a period P.sub.r that differ from the frequency and period of the sampling pulses. The mixing produces a beat signal at each input channel. A quantity termed 'effective measurement interval' which is equal to the difference of the periods of the sampling pulses, P.sub.o, and the reference signal, P.sub.r, is computed. A quantity termed 'apparent skew' which is equal to the number of periods P.sub.o of the sampling pulses which represents the skew or phase difference between the beat signals is also determined. Finally, skew or phase difference of the sampling pulses is computed by multiplying the 'effective measurement interval' by the 'apparent skew'.