Toronto, CA, United States of America

Genmao Chen

This inventor holds 1 USPTO granted patent. Top assignee: Csi Cells Co., Ltd.. Active years: 2010.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Genmao Chen. Retrieved from https://idiyas.com/inventor/genmao-chen

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2010

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1 patent (USPTO):Explore Patents

Title: Genmao Chen - Innovator in Metallurgical Silicon Analysis

Genmao Chen is a notable inventor based in Toronto, Canada. He has made significant contributions to the field of materials science, particularly in the analysis of refined metallurgical silicon. His innovative approach has the potential to enhance industrial applications in semiconductor manufacturing.

Latest Patents

Genmao Chen holds a patent for a method that detects and analyzes impurity content in refined metallurgical silicon. This method involves several key steps: selecting measuring points on crystal rods or ingots, measuring resistivity, estimating impurity content, and using regression analysis to determine the distribution of boron and phosphorus impurities. This invention is characterized by its simplicity, low cost, and suitability for industrial applications.

Career Highlights

Genmao Chen is associated with Csi Cells Co., Ltd., where he applies his expertise in materials science. His work focuses on improving the quality and efficiency of silicon used in various technological applications. His innovative methods have garnered attention in the industry for their practical implications.

Collaborations

Genmao Chen collaborates with Jiang Peng, contributing to advancements in the field of metallurgical silicon analysis. Their combined efforts aim to push the boundaries of current technologies and improve industrial processes.

Conclusion

Genmao Chen's contributions to the detection and analysis of impurities in refined metallurgical silicon represent a significant advancement in materials science. His innovative methods are poised to impact the semiconductor industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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