This inventor holds 1 USPTO granted patent and 2 published patent applications and 1 EPO patent. Top assignee: Nikon Metrology Nv. Active years: 2017.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2017
Title: Geert Vandenhoudt: Innovator in Optical Scanning Technology
Introduction
Geert Vandenhoudt is a notable inventor based in Kessel-lo, Belgium. He has made significant contributions to the field of optical scanning technology. His innovative work has led to the development of a unique scanning probe that enhances the dimensional acquisition of objects.
Latest Patents
Geert Vandenhoudt holds a patent for an optical scanning probe. This invention relates to a scanning probe designed for the dimensional acquisition of an object by irradiating it with light and detecting the reflected light. The scanning probe includes a detection unit with an imaging sensor and a sensor lens assembly for detecting the reflected light. Additionally, it features a light projecting unit that comprises a light source for generating light, source optics for focusing the light, and light plane generating optics for irradiating the object. An adjustment mechanism is also included in the light projecting unit, allowing for the adjustment of the position or orientation of the light plane relative to the detection unit.
Career Highlights
Geert Vandenhoudt is currently employed at Nikon Metrology NV, where he continues to work on advancements in metrology and optical technologies. His expertise in the field has positioned him as a key player in the development of innovative measurement solutions.
Collaborations
Throughout his career, Geert has collaborated with talented professionals such as Patrick Blanckaert and Frank Thys. These collaborations have fostered a creative environment that encourages the exchange of ideas and the development of cutting-edge technologies.
Conclusion
Geert Vandenhoudt's contributions to optical scanning technology exemplify his innovative spirit and dedication to advancing the field. His patent for the optical scanning probe showcases his ability to create solutions that enhance dimensional acquisition processes. His work at Nikon Metrology NV and collaborations with esteemed colleagues further highlight his impact on the industry.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile