This inventor holds 1 USPTO granted patent. Top assignee: Nxp B.v.. Active years: 2013.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2013
Title: Geert Seuren: Innovator in Testing Circuit Technology
Introduction
Geert Seuren is a notable inventor based in Roggel, Netherlands. He has made significant contributions to the field of testing circuits, showcasing his expertise through his innovative patent.
Latest Patents
Geert Seuren holds a patent for a "Testing circuit and method." This invention features a test interface circuit that operates with various types of core circuits. The test interface circuit includes a test input register (TIR) that selects an operating mode and multiple test point registers (TPRs). Each TPR controls signals passed from the input port to a mixed-signal core circuit, responding to the received test input signals and the selected operating mode. In static mode, each TPR provides serial access to digital inputs and outputs of a mixed-signal core circuit. In bypass mode, each TPR bypasses TPR slices to preserve test time when chained to other TPRs during the integration of at least two mixed-signal cores. Geert's innovative approach enhances the efficiency and effectiveness of testing circuits.
Career Highlights
Geert Seuren is associated with NXP B.V., a leading company in the semiconductor industry. His work at NXP B.V. has allowed him to develop and refine his inventions, contributing to advancements in technology.
Collaborations
Geert has collaborated with notable colleagues, including Vladimir Aleksandar Zivkovic and Frank Van Der Heijden. These collaborations have fostered a creative environment that encourages innovation and the development of cutting-edge technologies.
Conclusion
Geert Seuren's contributions to testing circuit technology exemplify his innovative spirit and dedication to advancing the field. His patent reflects a significant step forward in the efficiency of testing circuits, showcasing his role as a key inventor in this domain.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
