This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Framatome Gmbh. Active years: 2020.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2020
Title: Gautier Caput: Innovator in Surface Defect Detection
Introduction
Gautier Caput is a notable inventor based in Dijon, France. He has made significant contributions to the field of surface defect detection through his innovative methods and devices. His work is particularly relevant in industries where surface integrity is critical.
Latest Patents
Gautier Caput holds a patent for a "Method for detecting a defect on a surface by multidirectional lighting and associated device." This method involves acquiring multiple images of a surface using an optical device with varying lighting directions. The process includes calculating parameters that help determine whether a defect exists at specific points on the surface.
Career Highlights
Gautier Caput is associated with Framatome GmbH, where he applies his expertise in optical technologies. His innovative approach to defect detection has the potential to enhance quality control processes in various manufacturing sectors.
Collaborations
Gautier has worked alongside talented colleagues such as Matthieu Taglione and Clément Skopinski. Their collaborative efforts contribute to advancing technologies in their field.
Conclusion
Gautier Caput's work in surface defect detection exemplifies the impact of innovation in technology. His contributions are paving the way for improved quality assurance in manufacturing processes.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile