The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 12, 2020
Filed:
Apr. 05, 2017
Framatome, Courbevoie, FR;
Matthieu Taglione, Saint Etienne en Bresse, FR;
Clément Skopinski, Chalon sur Saone, FR;
Gautier Caput, Dijon, FR;
Framatome, Courbevoie, FR;
Abstract
A method for detecting a defect on a surface () by multidirectional lighting includes acquiring a plurality of images of the surface () using an optical device () having an optical axis, each image being acquired with a lighting of the surface along a lighting direction (E, E') given for each point of the surface () and an optical direction (O), the images being acquired with different lighting directions (E, E′) or different combinations and/or with different optical directions (O); for each point, calculating a plurality of parameters, the parameters including coefficients of an equation characterizing the response of said point of the surface as a function of the lighting direction (E, E′) and an observation direction (B, B′); and deducing from the calculated parameters whether the surface () has a defect at said point.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile