This inventor holds 2 USPTO granted patents and 2 EPO patents. Top assignee: Framatome Gmbh. Active years: 2020-2022.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2020-2022
Title: Clément Skopinski: Innovator in Surface Defect Detection
Introduction
Clément Skopinski is a notable inventor based in Chalon sur Saône, France. He has made significant contributions to the field of surface defect detection through his innovative patents. With a total of 2 patents, Skopinski has developed advanced methods and devices that enhance the accuracy of defect detection.
Latest Patents
Skopinski's latest patents include a "Device for detecting a defect on a surface using multidirectional lighting." This device features an optical device capable of acquiring images of a surface from various optical directions. It incorporates a lighting device with multiple light sources arranged in a hemisphere, allowing for comprehensive surface analysis. Each light source can be turned on or off, enabling the optical device to capture multiple images under different lighting conditions. The hemisphere has a diameter of 50 mm or less, making it a compact solution for defect detection.
Another significant patent is the "Method for detecting a defect on a surface by multidirectional lighting and associated device." This method involves acquiring several images of a surface using an optical device, with each image captured under varying lighting directions. By calculating parameters for each point on the surface, the method determines whether defects are present based on the response of the surface to different lighting and observation directions.
Career Highlights
Clément Skopinski is currently employed at Framatome GmbH, where he applies his expertise in optical technologies and defect detection. His work has contributed to advancements in quality control and inspection processes within the industry.
Collaborations
Skopinski collaborates with talented colleagues, including Matthieu Taglione and Gautier Caput. Their combined efforts in research and development have led to innovative solutions in the field of surface analysis.
Conclusion
Clément Skopinski's contributions to the field of surface defect detection through his patents demonstrate his commitment to innovation and quality. His work at Framatome GmbH and collaborations with skilled professionals further enhance the impact of his inventions.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
