Garry P Liddell

Title: Garry P Liddell: Innovator in Test Probe Technology

Introduction

Garry P Liddell is a notable inventor based in Portland, OR (US). He has made significant contributions to the field of electronics, particularly in the development of test probe technology. His innovative approach has led to the creation of a unique device that enhances the efficiency of logic analyzers.

Latest Patents

Garry holds a patent for a high-speed, low-profile test probe. This device features a body of insulating material molded directly onto a narrow elongate substrate that contains electrical circuitry. The molded insulating material includes a notch that exposes a conductive surface on the substrate. This exposed surface is crucial for establishing a ground connection between the substrate and the ground of a device under test. The design allows for adaptation in probe holders for multichannel probing, ensuring the shortest possible ground connections between the device under test and the probes.

Career Highlights

Garry has been associated with Tektronix, Inc., a leading company in the field of electronic test and measurement equipment. His work at Tektronix has allowed him to push the boundaries of technology and contribute to advancements in testing methodologies.

Collaborations

Throughout his career, Garry has collaborated with talented individuals such as Monty Smith and James E Trimble. These collaborations have fostered an environment of innovation and creativity, leading to the development of cutting-edge technologies.

Conclusion

Garry P Liddell's contributions to the field of test probe technology exemplify his dedication to innovation. His patent for the high-speed, low-profile test probe showcases his ability to solve complex problems in electronics. His work continues to influence the industry and inspire future inventors.