Miyagi, Japan

Gaku Shimoda

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Tokyo Electron Limited. Active years: 2018.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Gaku Shimoda. Retrieved from https://idiyas.com/inventor/gaku-shimoda

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 41(Granted Patents)


Company Filing History:


Years Active: 2018

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1 patent (USPTO):Explore Patents

Title: Gaku Shimoda: Innovator in Etching Technology

Introduction

Gaku Shimoda is a notable inventor based in Miyagi, Japan. He has made significant contributions to the field of semiconductor manufacturing, particularly through his innovative etching methods.

Latest Patents

Gaku Shimoda holds a patent for an etching method and etching apparatus. This method involves etching a silicon film formed on a substrate by supplying HBr gas, NF gas, and O gas into a chamber. The process includes performing multiple etching processes on the silicon film with plasma generated by the supplied gases. Notably, the flow rate of the HBr gas is gradually reduced during these processes, while the flow rate of the O gas is adjusted accordingly.

Career Highlights

Gaku Shimoda is associated with Tokyo Electron Limited, a leading company in the semiconductor industry. His work focuses on enhancing etching techniques, which are crucial for the production of advanced electronic devices.

Collaborations

Gaku Shimoda has collaborated with notable colleagues, including Hotaka Maruyama and Takanori Sato. Their combined expertise contributes to the advancement of innovative technologies in the semiconductor field.

Conclusion

Gaku Shimoda's contributions to etching technology exemplify the importance of innovation in the semiconductor industry. His patent and collaborative efforts continue to influence advancements in electronic manufacturing.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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