Almelo, Netherlands

Gabriel Blaj

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Panalytical B.v.. Active years: 2013.


% Patents Active = 100.0

 

Average Co-Inventor Count = 1.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 2013

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1 patent (USPTO):Explore Patents

Title: Innovations of Gabriel Blaj in Imaging Systems

Introduction

Gabriel Blaj is an accomplished inventor based in Almelo, Netherlands. He has made significant contributions to the field of imaging systems, particularly in the integration of X-ray diffraction and computed tomography technologies. His innovative work has the potential to enhance imaging techniques used in various scientific and industrial applications.

Latest Patents

Gabriel Blaj holds a patent for an advanced imaging system that combines X-ray diffraction (XRD) and computed tomography (CT) measurements. This system is designed to measure both XRD diffraction and absorption as a function of energy. The patent describes the use of a goniometer, a source, and a two-dimensional detector. Notably, the system employs relatively soft X-rays in the 5-25 keV range. Additionally, an integrated mounting unit is included to position the sample close to the detector, optimizing measurement accuracy.

Career Highlights

Gabriel Blaj is currently associated with Panalytical B.V., a company known for its expertise in analytical instrumentation. His role at Panalytical has allowed him to further develop his innovative ideas and contribute to the advancement of imaging technologies. His work is recognized for its potential impact on various fields, including materials science and medical imaging.

Conclusion

Gabriel Blaj's contributions to imaging systems through his patent demonstrate his innovative spirit and technical expertise. His work continues to influence the development of advanced imaging techniques, showcasing the importance of innovation in scientific research and industry.

Profile summary based on public USPTO records.
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