Fuchu, Japan

Fumio Toyoda

This inventor holds 1 USPTO granted patent. Top assignee: Hitachi-High-Technologies Corporation. Active years: 2006.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Fumio Toyoda. Retrieved from https://idiyas.com/inventor/fumio-toyoda-b5iol51f

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 8(Granted Patents)


Company Filing History:


Years Active: 2006

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1 patent (USPTO):Explore Patents

Title: Fumio Toyoda: Innovator in Mass Spectrometry

Introduction

Fumio Toyoda is a notable inventor based in Fuchu, Japan. He has made significant contributions to the field of mass spectrometry, particularly with his innovative patent for a time of flight mass spectrometer. His work is recognized within the scientific community and has implications for various applications in research and industry.

Latest Patents

Fumio Toyoda holds one patent, which is a time of flight mass spectrometer. This invention showcases his expertise and commitment to advancing technology in analytical instrumentation.

Career Highlights

Fumio Toyoda is associated with Hitachi High-Technologies Corporation, a company known for its cutting-edge technological advancements. His role at the company has allowed him to contribute to significant projects and innovations in the field of mass spectrometry.

Collaborations

Throughout his career, Fumio Toyoda has collaborated with talented individuals such as Mitsuru Onuma and Takuya Akashi. These collaborations have fostered a creative environment that encourages innovation and the development of new technologies.

Conclusion

Fumio Toyoda's contributions to mass spectrometry through his patent and work at Hitachi High-Technologies Corporation highlight his role as an influential inventor. His collaborations and innovative spirit continue to inspire advancements in the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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