Company Filing History:
1 out of 800 
1 out of 5 Years Active: 2010
Title: Fuminori Hasegawa: Innovator in Sample Preparation Technology
Introduction
Fuminori Hasegawa is a notable inventor based in Yamanashi, Japan. He has made significant contributions to the field of sample preparation for electron microscopy. His innovative approach has led to the development of a unique apparatus and method that enhances the quality of samples used in scientific observations.
Latest Patents
Hasegawa holds a patent for an "Apparatus and method for preparing samples." This invention is designed to prepare samples that are suitable for observations by electron microscopy. The process involves ion-etching the samples while tilting the sample stage reciprocally left and right about a tilting axis. The method ensures that even substances that are not easily etched by the ion beam can be effectively separated from the sample, thus preventing the formation of unetched portions.
Career Highlights
Throughout his career, Hasegawa has worked with prominent companies such as Jeol Ltd. and Jeol Engineering Co., Ltd. His experience in these organizations has allowed him to refine his skills and contribute to advancements in microscopy technology.
Collaborations
Hasegawa has collaborated with Tadanori Yoshioka, further enhancing his work in the field of sample preparation.
Conclusion
Fuminori Hasegawa's innovative contributions to sample preparation technology have made a significant impact in the field of electron microscopy. His patent and career achievements reflect his dedication to advancing scientific research.