This inventor holds 1 USPTO granted patent. Top assignee: Hitachi-High-Technologies Corporation. Active years: 2013.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2013
Title: Fujio Ohnishi: Innovator in Mass Spectroscopy
Introduction
Fujio Ohnishi is a prominent inventor based in Yokohama, Japan. He is known for his significant contributions to the field of mass spectrometry. His innovative work has led to the development of advanced technologies that enhance the efficiency and effectiveness of mass spectroscopes.
Latest Patents
Fujio Ohnishi holds a patent for a mass spectroscope and its adjusting method. This invention aims to reduce the operational load associated with adjusting the amplitude difference in mass spectroscopes. It also addresses the increase in power consumption that can occur due to discrepancies between the resonance frequency and the drive frequency. The patent describes a resonance circuit unit in the ion trap section that controls the amplitude difference adjustment and synchronizes the resonance frequency with the drive frequency based on measured data.
Career Highlights
Ohnishi is affiliated with Hitachi High-Technologies Corporation, where he has made significant strides in the development of mass spectrometry technologies. His work has been instrumental in advancing the capabilities of mass spectroscopes, making them more efficient and reliable for various applications.
Collaborations
Fujio Ohnishi has collaborated with notable colleagues, including Hisaaki Kanai and Masami Makuuchi. These partnerships have contributed to the successful development and implementation of innovative technologies in the field.
Conclusion
Fujio Ohnishi's contributions to mass spectrometry exemplify the impact of innovation in scientific research and technology. His patent for a mass spectroscope showcases his commitment to enhancing the functionality and efficiency of analytical instruments. Ohnishi's work continues to influence the field and inspire future advancements.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
