Fu-Min Huang

Title: Fu-Min Huang: Innovator in Physical Failure Analysis

Introduction

Fu-Min Huang is a prominent inventor based in Hsin-Chu, Taiwan. He has made significant contributions to the field of semiconductor technology, particularly in the area of physical failure analysis. His innovative methods have paved the way for improved diagnostics in semiconductor manufacturing.

Latest Patents

Fu-Min Huang holds a patent for a method titled "Physical failure analysis guiding methods." This patent involves providing a plurality of failure dies and performing chip probing on these dies to generate a data log that comprises electrical characteristics. The method includes automatic net tracing to identify failure candidate nodes and conducting failure layer analysis on the results. This systematic approach allows for the selection of physical failure analysis samples from the failure dies, enhancing the efficiency of the diagnostic process.

Career Highlights

Fu-Min Huang is currently employed at Taiwan Semiconductor Manufacturing Company Limited, a leading firm in the semiconductor industry. His work has been instrumental in advancing the methodologies used in failure analysis, contributing to the overall reliability and performance of semiconductor devices.

Collaborations

He has collaborated with notable colleagues such as Sunny Wu and Yen-Di Tsen, further enriching the innovative environment at his workplace. Their combined expertise fosters a culture of creativity and problem-solving within the company.

Conclusion

Fu-Min Huang's contributions to physical failure analysis exemplify the impact of innovation in the semiconductor industry. His patent and collaborative efforts continue to influence advancements in technology, ensuring the reliability of semiconductor products.