This inventor holds 1 USPTO granted patent. Top assignee: International Business Machines Corporation. Active years: 2001.
Company Filing History:
Years Active: 2001
Title: Fredrick Hayes Dill: Innovator in Semiconductor Identification
Introduction
Fredrick Hayes Dill is a notable inventor based in South Salem, NY (US). He has made significant contributions to the field of semiconductor manufacturing through his innovative patent. His work focuses on enhancing the identification processes within very large scale integrated circuit manufacturing.
Latest Patents
Fredrick Hayes Dill holds a patent for a "Method for writing single width bar codes on semiconductor wafers." This invention provides a single width bar code that exhibits inherent self-clocking characteristics, making it particularly useful for identifying semiconductor wafers. The bar codes are designed to be robust, reliable, and highly readable, even when faced with variations in scanning speed. Additionally, the codes are dense in terms of character representations per linear centimeter, which is crucial in semiconductor manufacturing where space is limited.
Career Highlights
Fredrick Hayes Dill is associated with the International Business Machines Corporation (IBM), where he has contributed to advancements in semiconductor technology. His work has been instrumental in improving the efficiency and accuracy of wafer identification processes.
Collaborations
Throughout his career, Fredrick has collaborated with notable colleagues, including Ricky A Rand and Douglas Craig Bossen. These collaborations have further enriched his contributions to the field.
Conclusion
Fredrick Hayes Dill's innovative approach to semiconductor identification through his patented method showcases his expertise and commitment to advancing technology in the industry. His contributions continue to impact the efficiency of semiconductor manufacturing processes.