Frederick P LaPlant

Title: Innovations of Frederick P LaPlant

Introduction

Frederick P LaPlant is a notable inventor based in Ann Arbor, MI (US). He has made significant contributions to the field of measurement systems, holding a total of 4 patents. His work focuses on processing measurement signals to derive values for physical parameters.

Latest Patents

LaPlant's latest patents include a method and system for processing measurement signals to obtain a value for a physical parameter. In this measurement system, time-varying physical signals containing frequency information related to a physical parameter of an object are measured to obtain corresponding time-varying measurement signals. The method involves extracting frequency information from these measurement signals, which includes at least one desired frequency. The physical signals are electromagnetic signals, and the object may be a film formed on a substrate, with the physical parameter potentially being the thickness of the layer. Another patent describes a similar method where the measurement signals are discrete time ultrasonic signals. Extraction is performed by transforming the ultrasonic signals to a Z-domain and converting at least one zero or pole in the Z-domain to the desired frequency and its decay rate.

Career Highlights

Frederick P LaPlant is currently associated with Perceptron, Inc., where he continues to innovate in measurement technologies. His work has been instrumental in advancing the capabilities of measurement systems.

Collaborations

LaPlant has collaborated with notable coworkers such as Jeffrey S White and John W Dixon, contributing to various projects and innovations in his field.

Conclusion

Frederick P LaPlant's contributions to measurement systems through his patents and collaborations highlight his role as a significant inventor in the industry. His innovative methods for processing measurement signals continue to impact the field positively.