Williston, VT, United States of America

Frederick H Roy, Iii


Average Co-Inventor Count = 6.9

ph-index = 2

Forward Citations = 4(Granted Patents)


Location History:

  • Burlington, VT (US) (2017 - 2020)
  • Williston, VT (US) (2017 - 2021)

Company Filing History:


Years Active: 2017-2021

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6 patents (USPTO):Explore Patents

Title: The Innovations of Frederick H. Roy, III

Introduction

Frederick H. Roy, III is a notable inventor based in Williston, Vermont, with a significant contribution to the field of integrated circuit testing. He holds a total of six patents, showcasing his innovative spirit and technical expertise. His work has had a profound impact on the technology industry, particularly in the development of probe card assemblies.

Latest Patents

One of his latest patents is a probe card assembly designed for nondestructive integrated circuit testing. This innovative assembly features an outer gimbal bearing with a tapered bearing surface mounted on the top surface of a printed circuit board. Additionally, it includes an inner gimbal bearing with a spherical bearing surface that contacts the tapered bearing surface of the outer gimbal bearing at a single point of contact around its circumference. Furthermore, a spring plate is mounted to the outer gimbal bearing, providing a downward force to a substrate, enhancing the efficiency and accuracy of testing processes.

Career Highlights

Frederick has worked with prominent companies in the technology sector, including International Business Machines Corporation (IBM) and Globalfoundries Inc. His experience in these organizations has allowed him to refine his skills and contribute to groundbreaking advancements in technology.

Collaborations

Throughout his career, Frederick has collaborated with talented individuals such as David Michael Audette and David Lewis Gardell. These partnerships have fostered an environment of innovation and creativity, leading to the development of cutting-edge technologies.

Conclusion

Frederick H. Roy, III is a distinguished inventor whose contributions to integrated circuit testing have made a lasting impact on the industry. His innovative designs and collaborative efforts continue to inspire advancements in technology.

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